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Properties of sputtered ZnS thin films for photovoltaic application

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dc.citedby14
dc.contributor.authorHaque F.en_US
dc.contributor.authorRahman K.S.en_US
dc.contributor.authorAkhtaruzzaman M.en_US
dc.contributor.authorAbdullah H.en_US
dc.contributor.authorKiong T.S.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid57191159774en_US
dc.contributor.authorid56348138800en_US
dc.contributor.authorid57195441001en_US
dc.contributor.authorid26025061200en_US
dc.contributor.authorid15128307800en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T06:51:13Z
dc.date.available2023-05-29T06:51:13Z
dc.date.issued2018
dc.descriptionEnergy gap; II-VI semiconductors; Lime; Magnetron sputtering; Optical band gaps; Optical properties; Sputtering; Substrates; Surface morphology; Surface roughness; Thin films; Topography; X ray diffraction; Zinc sulfide; Hall effect measurement; Optical and electrical properties; Photovoltaic applications; Preferential orientation; RF magnetron sputtering technique; Soda lime glass substrate; Structural determination; ZnS thin films; Optical filmsen_US
dc.description.abstractZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images. � 2018 IOP Publishing Ltd.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo96409
dc.identifier.doi10.1088/2053-1591/aad6c6
dc.identifier.issue9
dc.identifier.scopus2-s2.0-85052313385
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85052313385&doi=10.1088%2f2053-1591%2faad6c6&partnerID=40&md5=371e3ab20ce0c6faa3b26115414fcdd3
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/23719
dc.identifier.volume5
dc.publisherInstitute of Physics Publishingen_US
dc.sourceScopus
dc.sourcetitleMaterials Research Express
dc.titleProperties of sputtered ZnS thin films for photovoltaic applicationen_US
dc.typeArticleen_US
dspace.entity.typePublication
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