Publication:
Properties of sputtered ZnS thin films for photovoltaic application

Date
2018
Authors
Haque F.
Rahman K.S.
Akhtaruzzaman M.
Abdullah H.
Kiong T.S.
Amin N.
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Institute of Physics Publishing
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Abstract
ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images. � 2018 IOP Publishing Ltd.
Description
Energy gap; II-VI semiconductors; Lime; Magnetron sputtering; Optical band gaps; Optical properties; Sputtering; Substrates; Surface morphology; Surface roughness; Thin films; Topography; X ray diffraction; Zinc sulfide; Hall effect measurement; Optical and electrical properties; Photovoltaic applications; Preferential orientation; RF magnetron sputtering technique; Soda lime glass substrate; Structural determination; ZnS thin films; Optical films
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