Publication: Properties of sputtered ZnS thin films for photovoltaic application
Date
2018
Authors
Haque F.
Rahman K.S.
Akhtaruzzaman M.
Abdullah H.
Kiong T.S.
Amin N.
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Physics Publishing
Abstract
ZnS thin films were deposited on soda lime glass substrates by RF magnetron sputtering technique with the variation in radio-frequency (RF) power. A study on the structural, surface topography, surface morphology, optical and electrical properties of the deposited ZnS thin films was carried out through XRD, AFM, FESEM, UV-vis spectrometry and Hall Effect measurement. Structural determination by XRD method indicated that the films are of polycrystalline nature with a strong preferential orientation along the (111) reflection plane exhibiting a cubic or zinc-blende structure for the films deposited at 60 W and above. The optical properties of the films were ascertained for the photon wavelength ranging from 350 to 900 nm. The bandgap was found in the range of 3.22-3.44 eV. The surface roughness and the morphology of the films were also affected by the RF powers as observed from the AFM and FESEM images. � 2018 IOP Publishing Ltd.
Description
Energy gap; II-VI semiconductors; Lime; Magnetron sputtering; Optical band gaps; Optical properties; Sputtering; Substrates; Surface morphology; Surface roughness; Thin films; Topography; X ray diffraction; Zinc sulfide; Hall effect measurement; Optical and electrical properties; Photovoltaic applications; Preferential orientation; RF magnetron sputtering technique; Soda lime glass substrate; Structural determination; ZnS thin films; Optical films