Publication: Emi Data Measurement And Analysis Of Diffrent High Voltage Environment
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Date
2020-02
Authors
Chung Yong Sheng
Journal Title
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Abstract
The EMC problems has been well known to the people as many of us is getting
electronic devices on hand. The electronic that we use all times has very high sensitivity
towards the electric voltage especially the ICs. When the EMI radiates through the
surrounding of the electronics, it may produce a parasite voltage which may cause the
electronics to generate error. The error is a big problem when it gets to the electronics
stability, which some high risk electronic such as transportation, aviation and medical
implanted devices. The EMC interferences may lead to a disaster that no ones wish to
be. In this research, the radiated emission of high voltage environment equipment will
be revised and verified it compliancy towards international standards.
Description
FYP 2 SEM 2 2019/2020
Keywords
Measurement And Analysis