Publication: Emi Data Measurement And Analysis Of Diffrent High Voltage Environment
dc.contributor.author | Chung Yong Sheng | en_US |
dc.date.accessioned | 2023-05-03T17:04:41Z | |
dc.date.available | 2023-05-03T17:04:41Z | |
dc.date.issued | 2020-02 | |
dc.description | FYP 2 SEM 2 2019/2020 | en_US |
dc.description.abstract | The EMC problems has been well known to the people as many of us is getting electronic devices on hand. The electronic that we use all times has very high sensitivity towards the electric voltage especially the ICs. When the EMI radiates through the surrounding of the electronics, it may produce a parasite voltage which may cause the electronics to generate error. The error is a big problem when it gets to the electronics stability, which some high risk electronic such as transportation, aviation and medical implanted devices. The EMC interferences may lead to a disaster that no ones wish to be. In this research, the radiated emission of high voltage environment equipment will be revised and verified it compliancy towards international standards. | en_US |
dc.identifier.uri | https://irepository.uniten.edu.my/handle/123456789/21498 | |
dc.language.iso | en | en_US |
dc.subject | Measurement And Analysis | en_US |
dc.title | Emi Data Measurement And Analysis Of Diffrent High Voltage Environment | en_US |
dspace.entity.type | Publication |