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A comparative study of CdS thin films grown on ultra-thin glass substrates by RF magnetron sputtering and chemical bath deposition

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dc.citedby9
dc.contributor.authorDoroody C.en_US
dc.contributor.authorRahman K.S.en_US
dc.contributor.authorRosly H.N.en_US
dc.contributor.authorHarif M.N.en_US
dc.contributor.authorIsah M.en_US
dc.contributor.authorKar Y.B.en_US
dc.contributor.authorTiong S.K.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid56905467200en_US
dc.contributor.authorid56348138800en_US
dc.contributor.authorid36873451800en_US
dc.contributor.authorid22634024000en_US
dc.contributor.authorid57219626175en_US
dc.contributor.authorid26649255900en_US
dc.contributor.authorid15128307800en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T09:05:54Z
dc.date.available2023-05-29T09:05:54Z
dc.date.issued2021
dc.descriptionAtomic force microscopy; Cadmium sulfide; Chemical analysis; Energy gap; Field emission microscopes; Glass; Hall effect; II-VI semiconductors; Magnetron sputtering; Scanning electron microscopy; Substrates; X ray diffraction; Zinc sulfide; Atomic-force-microscopy; Cadmium sulphide thin films; Chemical-bath deposition; Deposition films; Field emission scanning electron microscopy; Radio-frequency-magnetron sputtering; Sputtered films; Thin glass substrates; Ultra-thin; Ultra-thin glass; Thin filmsen_US
dc.description.abstractThe structural, morphological and optoelectrical characteristics of cadmium sulfide (CdS) thin films grown on ultra-thin glass substrates via Radio Frequency (RF) magnetron sputtering and chemical bath deposition (CBD) have been explored in this study. CdS thin films were characterized using the X-ray Diffraction (XRD), Field Emission Scanning Electron Microscopy (FESEM), Atomic Force Microscopy (AFM), UV�Vis spectrophotometer and Hall effect measurement system. As obvious from XRD investigation, the stable hexagonal wurtzite crystalline structure with (002) preferential orientation was resulted from both deposition methods. FESEM study demonstrated uniform grain structure for the sputtered films. Compositional analysis confirmed that S/Cd ratio is 0.28 for the sputtered films and 0.20 for the CBD films. AFM study exhibited spherical crystal surface formation, hills and valleys for CBD films. The optical analysis showed a band gap of 2.40 eV and 2.32 eV for the sputtering and the CBD methods, respectively. Hall effect analysis recorded carrier concentration and resistivity in the order of 1013 cm?3 and 104 ? cm, respectively. The experimental results recommend that the CdS thin films grown by the sputtering might be favourable as the window layer for solar cell application. � 2021 Elsevier Ltden_US
dc.description.natureFinalen_US
dc.identifier.ArtNo105935
dc.identifier.doi10.1016/j.mssp.2021.105935
dc.identifier.scopus2-s2.0-85106921569
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85106921569&doi=10.1016%2fj.mssp.2021.105935&partnerID=40&md5=b581c35f8f7be489b44e6b0e44418714
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/25986
dc.identifier.volume133
dc.publisherElsevier Ltden_US
dc.sourceScopus
dc.sourcetitleMaterials Science in Semiconductor Processing
dc.titleA comparative study of CdS thin films grown on ultra-thin glass substrates by RF magnetron sputtering and chemical bath depositionen_US
dc.typeArticleen_US
dspace.entity.typePublication
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