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Under voltage load shedding using voltage stability indices

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dc.citedby5
dc.contributor.authorHamid M.H.A.en_US
dc.contributor.authorHashim H.en_US
dc.contributor.authorRashid H.A.A.en_US
dc.contributor.authorAbidin I.Z.en_US
dc.contributor.authorid57202695924en_US
dc.contributor.authorid56644250200en_US
dc.contributor.authorid57197120294en_US
dc.contributor.authorid35606640500en_US
dc.date.accessioned2023-05-16T02:46:58Z
dc.date.available2023-05-16T02:46:58Z
dc.date.issued2014
dc.description.abstractVoltage instability is characterized by loss of a stable operating point due to reactive power deficiency, which causes a drop of voltage profile in significant part of the system. The voltage is stable if the system can maintain its voltage within the acceptable limits when there is a change in load admittance. Voltage collapse may occur when the system is subjected to system fault(s); the occurrence of this phenomenon can be either slowly or drastically depending on the severity of the fault(s) [1]. Therefore, it is more accurate to analyze the system behavior dynamically with respect to voltage stability. This paper presents under voltage load shedding scheme using voltage stability indexes based on system behavior in dynamic environment. © 2014 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo6873882
dc.identifier.doi10.1109/ISGT-Asia.2014.6873883
dc.identifier.epage736
dc.identifier.scopus2-s2.0-84906674305
dc.identifier.spage732
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84906674305&doi=10.1109%2fISGT-Asia.2014.6873883&partnerID=40&md5=75a8aa39ac54588ea6fed862793be621
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/22051
dc.publisherIEEE Computer Societyen_US
dc.sourceScopus
dc.sourcetitle2014 IEEE Innovative Smart Grid Technologies - Asia, ISGT ASIA 2014
dc.titleUnder voltage load shedding using voltage stability indicesen_US
dc.typeConference Paperen_US
dspace.entity.typePublication
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