Publication:
Evolution of interfacial defects and energy losses during aging of organic photovoltaics

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dc.citedby0
dc.contributor.authorLiu P.en_US
dc.contributor.authorHuang Y.en_US
dc.contributor.authorWang Z.en_US
dc.contributor.authorLiu W.en_US
dc.contributor.authorYap B.en_US
dc.contributor.authorHe Z.en_US
dc.contributor.authorWu H.en_US
dc.contributor.authorid58862117000en_US
dc.contributor.authorid58754071300en_US
dc.contributor.authorid58754202600en_US
dc.contributor.authorid57434016100en_US
dc.contributor.authorid26649255900en_US
dc.contributor.authorid35364405700en_US
dc.contributor.authorid57835140200en_US
dc.date.accessioned2025-03-03T07:44:30Z
dc.date.available2025-03-03T07:44:30Z
dc.date.issued2024
dc.description.abstractAs the power conversion efficiencies of Organic Solar Cells (OSCs) approach 20 %, the stability of the device becomes an increasingly urgent issue. To enhance device stability, it is crucial to identify potential loss mechanisms. In this study, we investigated the trap-state-dependent degradation mechanism of OSCs by directly comparing devices with different hole transport layers (HTLs) that introduce distinct interfacial defect distributions. Employing electrochemical impedance spectroscopy (EIS), Fourier transform photocurrent spectroscopy (FTPS), electroluminescence quantum efficiency (EQEEL), and temperature-dependent J-V techniques, we unraveled the relationship between device degradation and interfacial trap states and energy loss in PM6:Y6 devices. A lower density of interfacial deep traps is evidently correlated with smaller non-radiative recombination losses during the aging of devices based on PEDOT:PSS. Conversely, a higher density of deep traps in aged devices with WS2 interlayers and HTL-free configurations is presumed to be responsible for a significant increase in non-radiative recombination losses. The escalating deep-trap-state density in aged devices is observed to elevate carrier recombination, consequently deteriorating device performance. Beyond the scope of the energy balance theory, an additional factor, probably attributed to the change in the work function of ITO, was found to contribute significantly to energy loss in aged cells, particularly in HTL-free devices. These results highlight the potential for improving device stability via interface engineering. ? 2024 Elsevier B.V.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo415707
dc.identifier.doi10.1016/j.physb.2024.415707
dc.identifier.scopus2-s2.0-85184028388
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85184028388&doi=10.1016%2fj.physb.2024.415707&partnerID=40&md5=9d84a43212667673516be8b7b55dcfe5
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/36765
dc.identifier.volume677
dc.publisherElsevier B.V.en_US
dc.sourceScopus
dc.sourcetitlePhysica B: Condensed Matter
dc.subjectConducting polymers
dc.subjectConversion efficiency
dc.subjectDefect states
dc.subjectDegradation
dc.subjectElectrochemical impedance spectroscopy
dc.subjectOrganic solar cells
dc.subjectQuantum theory
dc.subjectSemiconductor quantum wells
dc.subjectSolar power generation
dc.subjectTungsten compounds
dc.subjectDeep traps
dc.subjectDefect state
dc.subjectDevice stability
dc.subjectHole transport layers
dc.subjectInterfacial defect
dc.subjectInterfacial defect state
dc.subjectNonradiative recombination
dc.subjectOrganic photovoltaics
dc.subjectRecombination
dc.subjectRecombination loss
dc.subjectWork function
dc.titleEvolution of interfacial defects and energy losses during aging of organic photovoltaicsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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