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Effect of substrate temperature on the properties of RF sputtered CdS thin films for solar cell applications

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dc.citedby25
dc.contributor.authorDas N.K.en_US
dc.contributor.authorChakrabartty J.en_US
dc.contributor.authorFarhad S.F.U.en_US
dc.contributor.authorSen Gupta A.K.en_US
dc.contributor.authorIkball Ahamed E.M.K.en_US
dc.contributor.authorRahman K.S.en_US
dc.contributor.authorWafi A.en_US
dc.contributor.authorAlkahtani A.A.en_US
dc.contributor.authorMatin M.A.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid34867805900en_US
dc.contributor.authorid56007962800en_US
dc.contributor.authorid57219816966en_US
dc.contributor.authorid12647023800en_US
dc.contributor.authorid57204121738en_US
dc.contributor.authorid56348138800en_US
dc.contributor.authorid57216083278en_US
dc.contributor.authorid55646765500en_US
dc.contributor.authorid57220488718en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T08:09:48Z
dc.date.available2023-05-29T08:09:48Z
dc.date.issued2020
dc.description.abstractWe report the effect of substrate temperature (25�300 �C) on the structural, optical and electrical properties of Cadmium Sulphide (CdS) thin films deposited onto glass substrate by Radio Frequency (RF) magnetron sputtering. The structural, morphological, optical and electrical properties of the films were characterized by X-ray diffraction (XRD), Field emission scanning electron microscopy (FE-SEM), UV�VIS-NIR spectroscopy and Hall Effect measurement respectively. The XRD studies showed that the films were polycrystalline with hexagonal wurtzite structure preferentially oriented along the (0 0 2) plane parallel to the substrate surface. The XRD data analysis further revealed the crystallite size of the nanocrystalline films i.e. 22�24 nm exhibiting the fact that crystallite size increased with increasing the substrate temperature. The FE-SEM images along with energy dispersive spectroscopy (EDS) studies confirmed the homogeneous, compact and pin-hole free surface morphology. The UV�VIS-NIR studies unveiled the optical transmittance in the range of 75�90% after 540 nm of the wavelength of light. The optical band gaps were found to be decreasing from 2.34 eV to 2.26 eV with increasing the substrate temperature. The films were characterized as n-type as evidenced by the Hall Effect measurement. The carrier mobility was found to be increasing gradually from 5.53 to 12.57 cm2/V�s by increasing the substrate temperature from room temperature to 300 �C due to the improvement of crystalline quality and grain size of the films. The results showed good optical and electrical properties of the films deposited at 300 �C which are suitable to use as window layer in thin film based solar cells. � 2020 The Authorsen_US
dc.description.natureFinalen_US
dc.identifier.ArtNo103132
dc.identifier.doi10.1016/j.rinp.2020.103132
dc.identifier.scopus2-s2.0-85085129901
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85085129901&doi=10.1016%2fj.rinp.2020.103132&partnerID=40&md5=642c27ad6deb5fe6ea9009f0842261d0
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/25469
dc.identifier.volume17
dc.publisherElsevier B.V.en_US
dc.relation.ispartofAll Open Access, Gold
dc.sourceScopus
dc.sourcetitleResults in Physics
dc.titleEffect of substrate temperature on the properties of RF sputtered CdS thin films for solar cell applicationsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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