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Effects of growth temperatures on the structural and optoelectronic properties of sputtered zinc sulfide thin films for solar cell applications

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dc.citedby8
dc.contributor.authorHaque F.en_US
dc.contributor.authorRahman K.S.en_US
dc.contributor.authorIslam M.A.en_US
dc.contributor.authorYusoff Y.en_US
dc.contributor.authorKhan N.A.en_US
dc.contributor.authorNasser A.A.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid57191159774en_US
dc.contributor.authorid56348138800en_US
dc.contributor.authorid57220973693en_US
dc.contributor.authorid57206844407en_US
dc.contributor.authorid56523866700en_US
dc.contributor.authorid55646765500en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T07:24:21Z
dc.date.available2023-05-29T07:24:21Z
dc.date.issued2019
dc.descriptionBuffer layers; Growth temperature; II-VI semiconductors; Sputtering; Sulfur compounds; Thin film solar cells; X ray diffraction; Zinc sulfide; Electrical characteristic; Film characterizations; Hall effect measurement; Optoelectronic properties; Preferential orientation; Solar-cell applications; Substrate temperature; Zinc sulfide thin films; Thin filmsen_US
dc.description.abstractThe role of various substrate temperatures on the structural and optoelectronic properties of sputtered zinc sulfide (ZnS) thin films has been investigated in this work. The study of prepared film characterization has been done by XRD, AFM, UV�Vis spectrometry and Hall-effect measurement analysis. XRD patterns of the room temperature grown films reveal an amorphous nature, while the films deposited at 100��C, 200��C. 300��C and 400��C are found to be polycrystalline having the (111) preferential orientation. The optical bandgap values are found in the range of 3.18�3.61�eV depending on the substrate temperatures. The bulk and surface carrier densities are found in the order of 1012 cm?3 and 107 cm?3, respectively. The growth temperatures are also observed to have a significant effect on the electrical characteristic of the deposited films. � 2019, Springer Science+Business Media, LLC, part of Springer Nature.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo278
dc.identifier.doi10.1007/s11082-019-1994-6
dc.identifier.issue8
dc.identifier.scopus2-s2.0-85070475899
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85070475899&doi=10.1007%2fs11082-019-1994-6&partnerID=40&md5=fe30d4036d34206a747bea501cebdd24
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/24539
dc.identifier.volume51
dc.publisherSpringer New York LLCen_US
dc.sourceScopus
dc.sourcetitleOptical and Quantum Electronics
dc.titleEffects of growth temperatures on the structural and optoelectronic properties of sputtered zinc sulfide thin films for solar cell applicationsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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