Publication:
Impact of CdTe thin film thickness in ZnxCd1?xS/CdTe solar cell by RF sputtering

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dc.citedby33
dc.contributor.authorHossain M.S.en_US
dc.contributor.authorRahman K.S.en_US
dc.contributor.authorKarim M.R.en_US
dc.contributor.authorAijaz M.O.en_US
dc.contributor.authorDar M.A.en_US
dc.contributor.authorShar M.A.en_US
dc.contributor.authorMisran H.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid57212814508en_US
dc.contributor.authorid56348138800en_US
dc.contributor.authorid56820318000en_US
dc.contributor.authorid57188713075en_US
dc.contributor.authorid8586960200en_US
dc.contributor.authorid56192464300en_US
dc.contributor.authorid6506899840en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T07:26:46Z
dc.date.available2023-05-29T07:26:46Z
dc.date.issued2019
dc.descriptionAtomic force microscopy; Cadmium sulfide; Cadmium sulfide solar cells; Cadmium telluride; Crystallinity; Efficiency; Film thickness; Glass; II-VI semiconductors; Lime; Magnetron sputtering; Optical properties; Scanning electron microscopy; Semiconductor alloys; Silver compounds; Thin film solar cells; Uranium metallography; Vanadium metallography; X ray diffraction; Zinc; Zinc metallography; Zinc sulfide; CdTe; Cell configurations; Optimum deposition; rf-Magnetron sputtering; Rf-sputtering; Structural and optical characterizations; Window layer; Zinc blend structure; Thin films; cadmium; film; fuel cell; scanning electron microscopy; solar power; tellurium; X-ray diffraction; zincen_US
dc.description.abstractThis paper presents the impact of thickness of RF sputtered CdTe thin film as an absorber layer through structural and optical characterization in ZnxCd1?xS/CdTe solar cells at lower concentration of zinc (Zn). The crystallographic, morphological and optical properties of CdTe thin film fabricated on top of bare soda-lime glass were elucidated by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and ultraviolet (UV) spectrophotometer. XRD spectra shows that crystallinity increases in thicker samples and the CdTe (1 1 1) diffraction peak intensity centered at 23.825� increases with the increase of film thickness confirming the zinc blend structure of CdTe thin film. The window layer ZnxCd1?xS was fabricated with optimum deposition conditions by co-sputtering of ZnS and CdS. The complete cell was fabricated by RF magnetron sputtering with the cell configuration of glass/FTO/ZnxCd1?xS/ZnTe/Ag. With the increasing thicknesses of CdTe the cell efficiency increases with the highest efficiency of 8.79% for 3.5 ?m of CdTe. This paves the way of novel window of ZnCdTe for smoothening the junction mismatches in hetero-junction CdTe thin film solar cells. � 2019 Elsevier Ltden_US
dc.description.natureFinalen_US
dc.identifier.doi10.1016/j.solener.2019.01.019
dc.identifier.epage566
dc.identifier.scopus2-s2.0-85060354106
dc.identifier.spage559
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85060354106&doi=10.1016%2fj.solener.2019.01.019&partnerID=40&md5=722529a427b4c83982bfdc91265dc8cc
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/24760
dc.identifier.volume180
dc.publisherElsevier Ltden_US
dc.sourceScopus
dc.sourcetitleSolar Energy
dc.titleImpact of CdTe thin film thickness in ZnxCd1?xS/CdTe solar cell by RF sputteringen_US
dc.typeArticleen_US
dspace.entity.typePublication
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