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Compositional disparity in Cu2ZnSnS4 (CZTS) thin film deposited by RF-sputtering from a single quaternary compound target

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dc.citedby27
dc.contributor.authorFerdaous M.T.en_US
dc.contributor.authorChelvanathan P.en_US
dc.contributor.authorShahahmadi S.A.en_US
dc.contributor.authorSapeli M.M.I.en_US
dc.contributor.authorSopian K.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid55567613100en_US
dc.contributor.authorid35766323200en_US
dc.contributor.authorid55567116600en_US
dc.contributor.authorid57201282111en_US
dc.contributor.authorid7003375391en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T06:51:55Z
dc.date.available2023-05-29T06:51:55Z
dc.date.issued2018
dc.descriptionCopper; Copper compounds; Deposition; Magnetron sputtering; Sputtering; Substrates; Tin compounds; Compositional variation; CZTS; Deposition Parameters; Industrial implementation; Process parameters; Quaternary compound; Radio frequency magnetron sputtering; Resource availability; Thin filmsen_US
dc.description.abstractCu2ZnSnS4 (CZTS) is highly researched photovoltaic (PV) material in recent years because of resource availability and non-toxicity of its constituents. Radio frequency (RF) magnetron sputtering is one of the potential methods of fabricating CZTS thin film due to its suitability for large scale industrial implementation. Of the three methods of depositing CZTS films by RF sputtering, one step single quaternary target sputtering is by far the simplest and straightforward one. However, deposition profile plays a crucial role in maintaining the integrity of pre-defined target composition transferred to glass substrates. In this study, several deposition parameters, such as RF power, working pressure, and target to sample distance were varied and their influences on corresponding compositional variation in deposited samples were studied. A quaternary CZTS target with pre-fixed composition (Cu = 22%, Zn = 15%, Sn = 13%, S = 50%) was used to deposit CZTS thin films at various depositing conditions. Among all deposition profiles, high RF power was found to be more detrimental with high Cu loss up to 53% from the original atomic composition. � 2018 Elsevier B.V.en_US
dc.description.natureFinalen_US
dc.identifier.doi10.1016/j.matlet.2018.03.098
dc.identifier.epage205
dc.identifier.scopus2-s2.0-85044141614
dc.identifier.spage201
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85044141614&doi=10.1016%2fj.matlet.2018.03.098&partnerID=40&md5=0389fcf39cf29976f5d0df7dd8f20fe8
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/23797
dc.identifier.volume221
dc.publisherElsevier B.V.en_US
dc.sourceScopus
dc.sourcetitleMaterials Letters
dc.titleCompositional disparity in Cu2ZnSnS4 (CZTS) thin film deposited by RF-sputtering from a single quaternary compound targeten_US
dc.typeArticleen_US
dspace.entity.typePublication
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