Publication:
Structural and optical properties of RF-sputtered CdTe thin films grown on CdS:O/CdS bilayers

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dc.citedby6
dc.contributor.authorDas N.K.en_US
dc.contributor.authorFarhad S.F.U.en_US
dc.contributor.authorChakaraborty J.en_US
dc.contributor.authorGupta A.K.S.en_US
dc.contributor.authorDey M.en_US
dc.contributor.authorAl-Mamun M.en_US
dc.contributor.authorMatin M.A.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid34867805900en_US
dc.contributor.authorid57219816966en_US
dc.contributor.authorid57216892093en_US
dc.contributor.authorid57203811680en_US
dc.contributor.authorid56297554400en_US
dc.contributor.authorid57924957700en_US
dc.contributor.authorid57220488718en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T08:13:28Z
dc.date.available2023-05-29T08:13:28Z
dc.date.issued2020
dc.descriptionCadmium sulfide; Cadmium telluride; Crystallite size; Energy gap; Glass substrates; II-VI semiconductors; Light transmission; Magnetron sputtering; Optical constants; Optical films; Optical properties; Argon ambient; Bi-layer; Different substrates; Polycrystalline; R.F. magnetron sputtering; RF sputtering; Structural and optical properties; Substrates temperature; Thin-films; XRD spectra; Thin filmsen_US
dc.description.abstractIn this work, we report the structural and optical properties of CdTe thin films on Oxygenated Cadmium Sulfide (CdS:O)/Cadmium Sulfide (CdS) bilayers using RF magnetron sputtering for different substrate temperatures (150, 200, 250, 300 and 350 �C) in Argon ambient. The XRD spectra reveal the polycrystalline nature of all the CdTe thin films with preferential cubic orientation along (111) directions. Raman Spectra show the dominant peak at 163.5 cm-1 and its overtone at 328.7 cm-1 which corresponds to the longitudinal optical (LO) phonon of CdTe. The SEM microscopy exhibits the uniform growth of CdTe films onto the entire glass substrate. Improved spectral response is observed for CdS:O layer and CdS:O/CdS bilayer in comparison with the CdS layer. The optical transmission of the CdTe films begins at the edge of 800 nm wavelength and shows interference fringe in the transmission spectra. The thickness of the deposited films and the optical constants are calculated from the fringe pattern. The thicknesses of the CdTe films are found to be increasing from 2.34 ?m to 2.82 ?m with the increasing substrate temperature i.e. from 150 to 250�C. Thereafter, the CdTe film thickness decreases to 2.24 ?m while the temperature increases further up to 350�C. The optical bandgap of the deposited CdTe films follows an increasing trend of 1.48 eV to 1.54 eV with the increase of substrate temperature 150 to 250�C after that the bandgap decreases to 1.51 eV for 350�C. Hence the obtained structural and optical properties suggest that the deposited CdTe films can be used as a suitable absorber layer for the thin film-based solar cells. � 2020, International Journal of Renewable Energy Research.en_US
dc.description.natureFinalen_US
dc.identifier.epage302
dc.identifier.issue1
dc.identifier.scopus2-s2.0-85085118232
dc.identifier.spage293
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85085118232&partnerID=40&md5=9a4c264b075df18715db5682c4a92878
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/25729
dc.identifier.volume10
dc.publisherInternational Journal of Renewable Energy Researchen_US
dc.sourceScopus
dc.sourcetitleInternational Journal of Renewable Energy Research
dc.titleStructural and optical properties of RF-sputtered CdTe thin films grown on CdS:O/CdS bilayersen_US
dc.typeArticleen_US
dspace.entity.typePublication
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