Publication:
Structural properties of CdS thin-films deposited by RF magnetron sputtering

dc.contributor.authorAhamed E.M.K.I.en_US
dc.contributor.authorGupta A.K.S.en_US
dc.contributor.authorKhan M.N.I.en_US
dc.contributor.authorMatin M.A.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid57204121738en_US
dc.contributor.authorid57203811680en_US
dc.contributor.authorid56610978700en_US
dc.contributor.authorid57220488718en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T07:23:41Z
dc.date.available2023-05-29T07:23:41Z
dc.date.issued2019
dc.descriptionBuffer layers; Cadmium sulfide; Chromium compounds; Copper compounds; Crystal structure; Crystallite size; Dislocations (crystals); II-VI semiconductors; Magnetron sputtering; Photoelectrochemical cells; Photovoltaic cells; Structural properties; Sulfur compounds; X ray diffraction; As-deposited films; Crystalline properties; Crystalline quality; Dislocation densities; rf-Magnetron sputtering; Rf-sputtering; Sputtering conditions; Thin film photovoltaic cells; Thin filmsen_US
dc.description.abstractCadmium Sulfide (CdS) thin-films were deposited by RF magnetron sputtering at different RF power ambient and their structural properties were studied to observe the effect of different sputtering conditions on the structural properties of CdS films. CdS is widely used buffer layer for chalcopyrite based photovoltaic cells and requires good crystalline property and less dislocation density as well as strain in conjunction with a thinner layer ensures good crystalline quality. The as deposited films were characterized by X-ray diffraction and the structural properties (crystal type, lattice alignment, lattice constant, crystalline size, microstrain, dislocation density, etc.) were analyzed. Analysis on structural properties shows that crystallite size increases and crystalline quality enhanced with higher RF power, while the dislocation density and developed strain declined for the same conditions. This investigation concluded that higher RF power sputtered CdS thin-films for lower time deposition can be more suitable for thin-film photovoltaic cell applications. � 2019 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo8975522
dc.identifier.doi10.1109/ICAEE48663.2019.8975522
dc.identifier.epage584
dc.identifier.scopus2-s2.0-85079358432
dc.identifier.spage581
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85079358432&doi=10.1109%2fICAEE48663.2019.8975522&partnerID=40&md5=29afee6c457095c1fa8d824f5ff52d25
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/24459
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceScopus
dc.sourcetitle2019 5th International Conference on Advances in Electrical Engineering, ICAEE 2019
dc.titleStructural properties of CdS thin-films deposited by RF magnetron sputteringen_US
dc.typeConference Paperen_US
dspace.entity.typePublication
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