Publication: Impact of Source to Substrate Distance on the Properties of Thermally Evaporated CdS Film
Date
2021
Authors
Dey M.
Das N.K.
Dey M.
Farhad S.F.U.
Matin M.A.
Amin N.
Journal Title
Journal ISSN
Volume Title
Publisher
Gazi Universitesi
Abstract
In this work, we present the effect of varying distances between source and substrate of the thermal evaporator on the structural, optical, and electrical properties of as-deposited Cadmium Sulfide thin-films. The CdS films were deposited on the borosilicate glass substrate using the thermal evaporation method under high vacuum conditions to optimize SSD. The variation of SSD greatly influences the physical properties of as-deposited CdS films caused the change in substrate temperature and density of incident adatoms of CdS. The structural and optical properties of as-deposited CdS films were analyzed by X-ray diffraction and UV-VIS-NIR spectroscopy. The Hall Effect Measurement System investigated the three main electrical properties (carrier concentration, carrier mobility, and resistivity) of the deposited CdS films. The XRD pattern of all the CdS thin-films exhibited the polycrystalline nature with the preferential hexagonal (002) plane. The CdS films deposited at 10 cm SSD showed better crystallographic properties among all the deposited films. The optical bandgap of the CdS films followed a decreasing trend from 2.44 eV to 2.37 eV as the SSD decreases from 14 cm to 8 cm due to the improvement of crystallinity of the deposited films. All the deposited CdS films showed the n-type property, and the carrier concentration of the CdS films increases from 3.78�1013 cm-3 to 4.41�1016 cm-3 as we decrease the SSD from 14 cm to 8 cm. The CdS films resistivity also decrease with the reduction of SSD. The characterization results suggest that the CdS films deposited at 10 cm SSD are suitable for photonic and thin-films solar cells. � 2021, International Journal of Renewable Energy Research. All Rights Reserved.
Description
Borosilicate glass; Glass substrates; Hall mobility; II-VI semiconductors; Infrared devices; Near infrared spectroscopy; Optical properties; Thermal evaporation; Thin films; Vacuum evaporation; X ray diffraction; CdS films; Deposited films; HEMS; Optical and electrical properties; Property; Source to substrate distances; Thermal evaporator; Thin-films; UV-vis-NIR; XRD; Cadmium sulfide