Publication:
Comparing simulation results and experimental measurements of electroluminescence phenomenon in dielectric materials

Simple item page
dc.citedby5
dc.contributor.authorAriffin A.M.en_US
dc.contributor.authorTajudin N.M.en_US
dc.contributor.authorSulaiman S.en_US
dc.contributor.authorThayoob Y.H.Md.en_US
dc.contributor.authorLewin P.L.en_US
dc.contributor.authorid16400722400en_US
dc.contributor.authorid57207881440en_US
dc.contributor.authorid36562570400en_US
dc.contributor.authorid6505876050en_US
dc.contributor.authorid7102386669en_US
dc.date.accessioned2023-12-28T07:17:52Z
dc.date.available2023-12-28T07:17:52Z
dc.date.issued2010
dc.description.abstractUnder continuous application of high electrical stresses, the insulation system of an underground power cable is subjected to long-term degradation that can eventually cause premature breakdown of the cable. This is as a result of electronic charges being injected into the dielectric material when intense electric field is applied. These charges will then interact with polymer molecules; causing even more charges to accumulate within the vicinity of the material and thus further deterioration. The interaction of the charges can lead to the dissipation of energy in the form of photons; a process known as electroluminescence (EL). In addition to space charge probing, the measurement of EL has becoming increasingly prominent in understanding the mechanisms that contribute to the early electrical ageing of an insulating material. This paper attempts to simulate EL behaviour based on the underlying hypotheses of charge injection and bipolar recombination processes that take place within a polymer. A detailed comparison between the computation results and the experimental measurements carried out by different researchers will be discussed in order to evaluate the mechanisms responsible for this phenomenon. �2010 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo5549833
dc.identifier.doi10.1109/ELINSL.2010.5549833
dc.identifier.scopus2-s2.0-77957346201
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-77957346201&doi=10.1109%2fELINSL.2010.5549833&partnerID=40&md5=128daf5d719abdbc1f62cb930d7b7306
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/29648
dc.sourceScopus
dc.sourcetitleConference Record of IEEE International Symposium on Electrical Insulation
dc.subjectAging
dc.subjectDielectric measurements
dc.subjectElectroluminescence
dc.subjectPrebreakdown in solids
dc.subjectSpace charge
dc.subjectBuilding materials
dc.subjectCables
dc.subjectElectric fields
dc.subjectElectric space charge
dc.subjectElectroluminescence
dc.subjectInsulation
dc.subjectLight
dc.subjectMultiphoton processes
dc.subjectTechnical presentations
dc.subjectAging
dc.subjectDielectric measurements
dc.subjectElectrical ageing
dc.subjectElectrical stress
dc.subjectElectronic charges
dc.subjectExperimental measurements
dc.subjectInsulation system
dc.subjectPolymer molecule
dc.subjectPrebreakdown
dc.subjectRecombination process
dc.subjectSimulation result
dc.subjectSpace charges
dc.subjectUnderground power cables
dc.subjectDielectric materials
dc.titleComparing simulation results and experimental measurements of electroluminescence phenomenon in dielectric materialsen_US
dc.typeConference Paperen_US
dspace.entity.typePublication
Files
Collections
SCOPUS