Publication:
A multidrop optical network testbed for EPON platform

dc.citedby0
dc.contributor.authorMajid M.S.A.en_US
dc.contributor.authorDin N.Md.en_US
dc.contributor.authorJamaludin Md.Z.en_US
dc.contributor.authorAl-Mansoori M.H.en_US
dc.contributor.authorMustafa I.S.en_US
dc.contributor.authorRadzi N.A.M.en_US
dc.contributor.authorSadon S.Kh.en_US
dc.contributor.authorid37018353800en_US
dc.contributor.authorid9335429400en_US
dc.contributor.authorid57216839721en_US
dc.contributor.authorid6505891021en_US
dc.contributor.authorid26967833900en_US
dc.contributor.authorid57218936786en_US
dc.contributor.authorid35590723900en_US
dc.date.accessioned2023-12-29T07:50:37Z
dc.date.available2023-12-29T07:50:37Z
dc.date.issued2010
dc.description.abstractIn an Ethernet Passive Optical Network (EPON) environment, the Optical Line Terminal (OLT) and Optical Network Unit (ONU) are the main end components that are required for the transfer of data. For the data transmission process, a communication protocol, i.e Multi-Point Control Protocol (MPCP) is required to avoid collision of the data that travel between the OLT and ONU This paper describes an effort in developing an EPON environment with MPCP for the OLT and ONU communications. A multidrop optical network testbed was developed on a platform intergrated with PIC microcontrollers. Although the microcontrollers have some limitations, the testbed can be used to test out protocols and algorithms for the EPON environment. �2010 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo5703975
dc.identifier.doi10.1109/SCORED.2010.5703975
dc.identifier.epage80
dc.identifier.scopus2-s2.0-79951966027
dc.identifier.spage77
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-79951966027&doi=10.1109%2fSCORED.2010.5703975&partnerID=40&md5=8f4243b5aa9822ea1622bcfef9caf120
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/30635
dc.pagecount3
dc.sourceScopus
dc.sourcetitleProceeding, 2010 IEEE Student Conference on Research and Development - Engineering: Innovation and Beyond, SCOReD 2010
dc.subjectCommunication
dc.subjectEngineering research
dc.subjectEthernet
dc.subjectFiber optic networks
dc.subjectInnovation
dc.subjectMicrocontrollers
dc.subjectOptical communication
dc.subjectTelecommunication networks
dc.subjectTest facilities
dc.subjectTestbeds
dc.subjectCommunication protocols
dc.subjectData transmission
dc.subjectEthernet passive optical networks
dc.subjectMultipoint control protocols
dc.subjectOptical line terminals
dc.subjectOptical network test-bed
dc.subjectOptical network units
dc.subjectPIC microcontrollers
dc.subjectPassive networks
dc.titleA multidrop optical network testbed for EPON platformen_US
dc.typeConference paperen_US
dspace.entity.typePublication
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