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A comprehensive comparative study of CdTe thin films grown on ultra-thin glass substrates by close-spaced sublimation and RF magnetron sputtering

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dc.citedby4
dc.contributor.authorDoroody C.en_US
dc.contributor.authorRahman K.S.en_US
dc.contributor.authorRosly H.N.en_US
dc.contributor.authorHarif M.N.en_US
dc.contributor.authorSopian K.en_US
dc.contributor.authorAbdullah S.F.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid56905467200en_US
dc.contributor.authorid56348138800en_US
dc.contributor.authorid36873451800en_US
dc.contributor.authorid22634024000en_US
dc.contributor.authorid7003375391en_US
dc.contributor.authorid14319069500en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T09:07:11Z
dc.date.available2023-05-29T09:07:11Z
dc.date.issued2021
dc.descriptionCadmium telluride; Crystallite size; II-VI semiconductors; Magnetron sputtering; Scanning electron microscopy; Sublimation; Substrates; Thin films; Cadmium telluride thin films; Close spaced sublimation; Comparatives studies; R.F. magnetron sputtering; RF sputtering; Sputtered films; Structural characteristics; Thin glass substrates; Ultra-thin; Ultra-thin glass; Glassen_US
dc.description.abstractThis study elucidates a comprehensive comparative study on the structural, morphological and electrical characteristics of cadmium telluride (CdTe) thin films grown on ultra-thin glass (UTG) substrates via close-spaced sublimation (CSS) and RF magnetron sputtering. Deposited CdTe films were characterized utilizing the X-ray Diffraction (XRD), Field Emission Scanning Electron Microscope (FESEM), and Hall effect measurement system. CdTe thin films were in cubic and hexagonal-cubic orientations based on the deposition methods. Micro-strain and dislocation density for sputtered films were very high compared to CSS films. Crystallite sizes were in the range of 30�40 nm for CSS films and 7�25 nm for sputtering films. Grain size was estimated to be around 2 �m and thickness was approximately 1.5 �m for both CSS and sputtering system. Resistivity was almost same as 6.98 � 104 ?-cm and 6.57 � 104 ?-cm for CSS and sputtered films, respectively. The experimental results suggest that the CdTe films grown by CSS might be favorable as the optimum absorber layer for solar cell application. � 2021 Elsevier B.V.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo129655
dc.identifier.doi10.1016/j.matlet.2021.129655
dc.identifier.scopus2-s2.0-85103085130
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85103085130&doi=10.1016%2fj.matlet.2021.129655&partnerID=40&md5=5f3dc4a7b828ded50df867f9e7b33d16
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/26147
dc.identifier.volume293
dc.publisherElsevier B.V.en_US
dc.sourceScopus
dc.sourcetitleMaterials Letters
dc.titleA comprehensive comparative study of CdTe thin films grown on ultra-thin glass substrates by close-spaced sublimation and RF magnetron sputteringen_US
dc.typeArticleen_US
dspace.entity.typePublication
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