Publication:
Space-Charge-Limited Dark Injection (SCL DI) transient measurements

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dc.citedby1
dc.contributor.authorYap B.K.en_US
dc.contributor.authorKoh S.P.en_US
dc.contributor.authorTiong S.K.en_US
dc.contributor.authorOng C.N.en_US
dc.contributor.authorid26649255900en_US
dc.contributor.authorid22951210700en_US
dc.contributor.authorid15128307800en_US
dc.contributor.authorid36570734800en_US
dc.date.accessioned2023-12-29T07:51:19Z
dc.date.available2023-12-29T07:51:19Z
dc.date.issued2010
dc.description.abstractIt is not an easy task to probe the mobility of nanoscale thin layers without using expensive and sophisticated equipments such as Time-of-flight photocurrent charge carrier mobility measurement. We present here a powerful yet cost-effective technique, namely the Space-Charge-Limited Dark Injection (SCL DI) Transient Measurement that allows us to confirm an ohmic injecting interface, to determine the mobility values of the bulk materials and to study the injection efficiency of the interfaces of the semiconductor materials. � 2010 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo5549542
dc.identifier.doi10.1109/SMELEC.2010.5549542
dc.identifier.epage194
dc.identifier.scopus2-s2.0-77957576466
dc.identifier.spage192
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-77957576466&doi=10.1109%2fSMELEC.2010.5549542&partnerID=40&md5=75f8cc803081b3b4134b5aa0347725db
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/30684
dc.pagecount2
dc.sourceScopus
dc.sourcetitleIEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
dc.subjectSemiconductor materials
dc.subjectTransient analysis
dc.subjectBulk materials
dc.subjectCharge-carrier mobility
dc.subjectDark injection
dc.subjectInjection efficiency
dc.subjectMobility value
dc.subjectNano scale
dc.subjectSpace-charge-limited
dc.subjectThin layers
dc.subjectTime-of-flight photocurrents
dc.subjectTransient measurement
dc.subjectCarrier mobility
dc.titleSpace-Charge-Limited Dark Injection (SCL DI) transient measurementsen_US
dc.typeConference paperen_US
dspace.entity.typePublication
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