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Dielectric verification of FR4 substrate using microstrip bandstop resonator and CAE tool

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dc.citedby5
dc.contributor.authorHock G.C.en_US
dc.contributor.authorChakrabarty C.K.en_US
dc.contributor.authorEmillianoen_US
dc.contributor.authorBadjian M.H.en_US
dc.contributor.authorid16021614500en_US
dc.contributor.authorid6701755282en_US
dc.contributor.authorid35974769600en_US
dc.contributor.authorid26967475500en_US
dc.date.accessioned2023-12-29T07:52:22Z
dc.date.available2023-12-29T07:52:22Z
dc.date.issued2009
dc.description.abstractThis paper describes a method to determine the dielectric constant of FR4 substrate material at the operating frequency of 2.3 GHz. The method make used of computer aided engineering (CAE) tool and microstrip bandstop resonator for investigating the dielectric value of a material. In accordance with the data sheet provided by manufacturer which is 4.5 at 10 MHz, a set of preliminary dielectric values are selected in order to explain the proposed technique. Microstrip bandstop resonators with different dimension are designed and analyzed with the electromagnetic simulator. They are fabricated using conventional wet-etching process which is relatively economical compared to other method. After that, the actual responses of the square ring resonators are measured with the vector network analyzer. By matching up the simulation results to the measured results, dielectric values selected earlier are tuned accordingly. The obtained values are used to validate the accuracy of the proposed method. The method is simple to practice. It provides the beginners a fast way and relatively straightforward method in investigating FR4 materials for their research and learning. �2009 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo5431459
dc.identifier.doi10.1109/MICC.2009.5431459
dc.identifier.epage898
dc.identifier.scopus2-s2.0-77952180166
dc.identifier.spage894
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-77952180166&doi=10.1109%2fMICC.2009.5431459&partnerID=40&md5=441074874a7cc1d5d11bf839510dd9fc
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/30746
dc.pagecount4
dc.sourceScopus
dc.sourcetitleProceedings - MICC 2009: 2009 IEEE 9th Malaysia International Conference on Communications with a Special Workshop on Digital TV Contents
dc.subjectComputer aided engineering
dc.subjectDielectric constant
dc.subjectDispersive
dc.subjectSquare ring resonator
dc.subjectComputer aided engineering
dc.subjectComputer crime
dc.subjectDigital television
dc.subjectElectric network analysis
dc.subjectElectric network analyzers
dc.subjectOptical resonators
dc.subjectPermittivity
dc.subjectBandstop resonators
dc.subjectData sheets
dc.subjectDielectric constants
dc.subjectDielectric values
dc.subjectDispersive
dc.subjectElectromagnetic simulators
dc.subjectFR4 substrates
dc.subjectMeasured results
dc.subjectMicrostripes
dc.subjectOperating frequency
dc.subjectSimulation result
dc.subjectSquare ring resonator
dc.subjectStraight-forward method
dc.subjectVector network analyzers
dc.subjectWet-etching process
dc.subjectComputational methods
dc.titleDielectric verification of FR4 substrate using microstrip bandstop resonator and CAE toolen_US
dc.typeConference paperen_US
dspace.entity.typePublication
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