Publication: Characterization of Intrinsic and Doped ZnO Thin-Films Deposited by RF Magnetron Sputtering for Chalcogenide Based Solar Cell Applications
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Date
2019
Authors
Gupta A.K.S.
Ahamed E.M.K.I.
Quamruzzaman M.
Matin M.A.
Rahaman K.S.
Amin N.
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers Inc.
Abstract
In high performance chalcogenide based thin-film solar cells, a bilayer intrinsic and doped zinc-oxide (ZnO) n-type stacks are used as window layer. Intrinsic ZnO and aluminum-doped ZnO thin-films were deposited on soda lime glass substrates using the standard recipe by radio-frequency (RF) magnetron sputtering with thickness 80 nm and 350 nm respectively. The structural, optical and electrical properties of the as deposited thin-films were studied by various characterization techniques such as X-Ray Diffractometry (XRD), UV-Vis spectroscopy and Hall-effect measurements. It was found from structural studies that both films are crystallographically oriented along (002) and (103) planes with hexagonal Wurtzite type. The optical transmittances and bandgaps were found around 90% (in visible and near infrared regions of spectrum) and 3.28 eV respectively. According to our findings, it is concluded that these as deposited films are suitable as window layer for promising chalcogenide Copper zinc tin sulphide (Cu2ZnSnS4, CZTS) based thin-film solar cells. � 2019 IEEE.
Description
Aluminum coatings; Chalcogenides; Copper compounds; II-VI semiconductors; Infrared devices; Lime; Magnetron sputtering; Metallic films; Optical films; Substrates; Sulfur compounds; Thin film solar cells; Tin compounds; Ultraviolet visible spectroscopy; X ray diffraction analysis; Zinc oxide; Zinc sulfide; Characterization techniques; Copper zinc tin sulphides; Intrinsic and doped zno; Optical and electrical properties; Radio frequency magnetron sputtering; rf-Magnetron sputtering; Soda lime glass substrate; Visible and near infrared; Thin films