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Deposition and characterization of RF-sputtered-Ta2O5 thin films for O2 reduction reaction in polymer electrolyte membrane fuel cells (PEMFC)

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dc.citedby5
dc.contributor.authorSamsudin N.en_US
dc.contributor.authorFerdaous M.T.en_US
dc.contributor.authorShahahmadi S.A.en_US
dc.contributor.authorMustafa S.N.en_US
dc.contributor.authorAkhtaruzzaman M.en_US
dc.contributor.authorSopian K.en_US
dc.contributor.authorChelvanathan P.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid57220937524en_US
dc.contributor.authorid55567613100en_US
dc.contributor.authorid55567116600en_US
dc.contributor.authorid57192685814en_US
dc.contributor.authorid57195441001en_US
dc.contributor.authorid7003375391en_US
dc.contributor.authorid35766323200en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T06:51:02Z
dc.date.available2023-05-29T06:51:02Z
dc.date.issued2018
dc.descriptionAnnealing; Catalysts; Cyclic voltammetry; Deposition; Electrolytic reduction; Gas fuel purification; Polyelectrolytes; Polymer films; Structural properties; Substrates; Tantalum oxides; Thin films; Orthorhombic phasis; Oxygen reduction reaction; Potentiostatic electrolysis; Rate of deposition; Silicon substrates; Substrate temperature; Ta2O5 thin films; Ta2O5sputtering; Proton exchange membrane fuel cells (PEMFC)en_US
dc.description.abstractTa2O5 thin films, proposed as the replacement of the precious Pt-based electro-catalyst in fuel cells, were sputtered on laser textured silicon substrate at 200 �C and then air annealed at 350 �C, 400 �C and 450 �C with the aim to improve crystallinity and uniformity. Characterization such as FESEM, XRD, Hall effect and Cyclic Voltammetry were employed to investigate the morphological, structural, electrical and electrochemical properties of the as-sputtered as well as annealed samples. Initial results showed that the films obtained by increasing the substrate temperature during sputtering are smoother and have better adhesion to the etched silicon substrates. It has also been observed that the rate of deposition increases resulting in thicker films for longer deposition time at higher temperature. Upon annealing, Ta2O5 films achieved better crystallinity consisting of orthorhombic phases. The average thicknesses of the films are in the range of 400 nm�700 nm. The proposed catalyst also shows better enhancement for oxygen reduction reaction (ORR) in prolonged time of continuous potentiostatic electrolysis as to be used in fuel cells. � 2018 Elsevier GmbHen_US
dc.description.natureFinalen_US
dc.identifier.doi10.1016/j.ijleo.2018.05.106
dc.identifier.epage303
dc.identifier.scopus2-s2.0-85047803766
dc.identifier.spage295
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85047803766&doi=10.1016%2fj.ijleo.2018.05.106&partnerID=40&md5=65d837c5f00b3bad4170d36117124d5a
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/23687
dc.identifier.volume170
dc.publisherElsevier GmbHen_US
dc.sourceScopus
dc.sourcetitleOptik
dc.titleDeposition and characterization of RF-sputtered-Ta2O5 thin films for O2 reduction reaction in polymer electrolyte membrane fuel cells (PEMFC)en_US
dc.typeArticleen_US
dspace.entity.typePublication
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