Publication:
Super-heterodyne interferometer for non-contact dielectric measurements on millimeter wave material

dc.citedby4
dc.contributor.authorHock G.C.en_US
dc.contributor.authorChakrabarty C.K.en_US
dc.contributor.authorBadjian M.H.en_US
dc.contributor.authorDevkumar S.en_US
dc.contributor.authorEmillianoen_US
dc.contributor.authorid16021614500en_US
dc.contributor.authorid6701755282en_US
dc.contributor.authorid26967475500en_US
dc.contributor.authorid26967443200en_US
dc.contributor.authorid35974769600en_US
dc.date.accessioned2023-12-29T07:56:06Z
dc.date.available2023-12-29T07:56:06Z
dc.date.issued2008
dc.description.abstractThis paper describes the use of AD8302 evaluation board from Analog Devices in superheterodyne millimeter wave interferometer for dielectric measurement. The measurements are performed without direct contact on the millimeter wave material. Signals from the output of two mixers in the interferometer were obtained for phase shifting analysis. They are used as inputs to the evaluation board. The output from the evaluation board was connected to computer for data processing. The voltage values obtained from the board was then converted to phase angle by using the pre-calibrated data and LabView� graphical programming language. � 2008 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo4897416
dc.identifier.doi10.1109/RFM.2008.4897416
dc.identifier.epage170
dc.identifier.scopus2-s2.0-77950649304
dc.identifier.spage167
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-77950649304&doi=10.1109%2fRFM.2008.4897416&partnerID=40&md5=c392d4971e7b5f3217945fafd1f6a619
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/30931
dc.pagecount3
dc.sourceScopus
dc.sourcetitle2008 IEEE International RF and Microwave Conference, RFM 2008
dc.subjectDielectric constant and millimeter wave
dc.subjectInterferometer
dc.subjectPhase sensitive detector
dc.subjectSuperheterodyne
dc.subjectData processing
dc.subjectHeterodyning
dc.subjectInterferometers
dc.subjectMicrowaves
dc.subjectMillimeter waves
dc.subjectPermittivity
dc.subjectAnalog devices
dc.subjectDielectric constant and millimeter wave
dc.subjectDielectric constants
dc.subjectDielectric measurements
dc.subjectDirect contact
dc.subjectEvaluation board
dc.subjectGraphical programming language
dc.subjectHeterodyne interferometer
dc.subjectLabViEW
dc.subjectNon-contact
dc.subjectPhase angles
dc.subjectPhase sensitive detectors
dc.subjectPhase-shifting
dc.subjectMillimeter wave devices
dc.titleSuper-heterodyne interferometer for non-contact dielectric measurements on millimeter wave materialen_US
dc.typeConference paperen_US
dspace.entity.typePublication
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