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Complex permittivity measurement using capacitance method from 300 kHz to 50 MHz

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dc.citedby22
dc.contributor.authorRaymond W.J.K.en_US
dc.contributor.authorChakrabarty C.K.en_US
dc.contributor.authorHock G.C.en_US
dc.contributor.authorGhani A.B.en_US
dc.contributor.authorid57520751700en_US
dc.contributor.authorid6701755282en_US
dc.contributor.authorid16021614500en_US
dc.contributor.authorid24469638000en_US
dc.date.accessioned2023-12-28T04:13:01Z
dc.date.available2023-12-28T04:13:01Z
dc.date.issued2013
dc.description.abstractComplex permittivity measurement has been performed using a parallel plate capacitor and a vector network analyzer (VNA) from 300 kHz to 50 MHz. The material under test (MUT) is a flat and thin sample clamped between the capacitor plates and connected to the VNA to obtain its two port S parameters. The S parameter is converted into impedance to calculate the complex permittivity using Matlab program. Techniques used to overcome the air gap and stray capacitance was described. Measurement obtained using the proposed method was compared with the free space method to validate its accuracy. The percent difference is less than 5%. � 2013 Published by Elsevier Ltd.en_US
dc.description.natureFinalen_US
dc.identifier.doi10.1016/j.measurement.2013.06.039
dc.identifier.epage3801
dc.identifier.issue10
dc.identifier.scopus2-s2.0-84883521594
dc.identifier.spage3796
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84883521594&doi=10.1016%2fj.measurement.2013.06.039&partnerID=40&md5=b0d42e101af54281084c2471f44b1085
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/29427
dc.identifier.volume46
dc.pagecount5
dc.publisherElsevier B.V.en_US
dc.sourceScopus
dc.sourcetitleMeasurement: Journal of the International Measurement Confederation
dc.subjectComplex permittivity
dc.subjectComponent
dc.subjectDielectric constant
dc.subjectMeasurement
dc.subjectParallel plate capacitor
dc.subjectVector network analyzer
dc.subjectVNA
dc.subjectCapacitance
dc.subjectCapacitors
dc.subjectMATLAB
dc.subjectMeasurements
dc.subjectPermittivity
dc.subjectPermittivity measurement
dc.subjectComplex permittivity
dc.subjectComponent
dc.subjectParallel plate capacitors
dc.subjectVector network analyzers
dc.subjectVNA
dc.subjectElectric network analyzers
dc.titleComplex permittivity measurement using capacitance method from 300 kHz to 50 MHzen_US
dc.typeArticleen_US
dspace.entity.typePublication
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