Publication: Structural, morphological, electrical and electron transport studies in ZnO�rGO (wt%�=�0.01, 0.05 and 0.1) based dye-sensitized solar cell
dc.citedby | 23 | |
dc.contributor.author | Abdullah H. | en_US |
dc.contributor.author | Atiqah N.A. | en_US |
dc.contributor.author | Omar A. | en_US |
dc.contributor.author | Asshaari I. | en_US |
dc.contributor.author | Mahalingam S. | en_US |
dc.contributor.author | Razali Z. | en_US |
dc.contributor.author | Shaari S. | en_US |
dc.contributor.author | Mandeep J.S. | en_US |
dc.contributor.author | Misran H. | en_US |
dc.contributor.authorid | 26025061200 | en_US |
dc.contributor.authorid | 57192404560 | en_US |
dc.contributor.authorid | 55641720200 | en_US |
dc.contributor.authorid | 26667546600 | en_US |
dc.contributor.authorid | 55434075500 | en_US |
dc.contributor.authorid | 57209440366 | en_US |
dc.contributor.authorid | 6603595092 | en_US |
dc.contributor.authorid | 13105366200 | en_US |
dc.contributor.authorid | 6506899840 | en_US |
dc.date.accessioned | 2023-05-29T06:00:30Z | |
dc.date.available | 2023-05-29T06:00:30Z | |
dc.date.issued | 2015 | |
dc.description | Atomic force microscopy; Chemical analysis; Deposition; Efficiency; Electron transport properties; Graphene; II-VI semiconductors; Open circuit voltage; Oxide films; Oxide minerals; Reduced Graphene Oxide; Scanning electron microscopy; Substrates; Thin films; Tin oxides; X ray powder diffraction; Zinc oxide; Zinc sulfide; ZnO nanoparticles; Chemical bath deposition methods; Chemical diffusion coefficients; Fluorine doped tin oxide; Hexagonal wurtzite structure; Photocurrent density; Photovoltaic performance; Power conversion efficiencies; Transport resistance; Dye-sensitized solar cells | en_US |
dc.description.abstract | Zinc oxide�reduced graphene oxide (ZnO�rGO) thin films were fabricated on a fluorine-doped tin oxide glass substrate by a chemical bath deposition method. The thin films were immersed in the Eosin Y dye for 24 and 48�h to be fabricated as a dye-sensitized solar cell. ZnO hexagonal wurtzite structures were analyzed by X-ray diffraction analysis. Field effect scanning electron microscope showed the images of ZnO nanoparticles and nanobranches. The atomic force microscopy analysis estimated the average roughness of ZnO�rGO films doped with 0.01, 0.05 and 0.1�wt% which varied from 178 to 267�nm. The electrical or photovoltaic performance of ZnO�rGO were measured and compared accordingly by considering their power conversion efficiency, ?, photocurrent density, Jsc, open-circuit voltage, Voc and fill factor, FF. The cell�s efficiency of ZnO with 0.01�wt% rGO, 0.05�wt% rGO and 0.1�wt% rGO reached ?�=�2.36, 0.78 and 0.38�%, respectively. EIS analysis estimated the effective electron lifetime, ?eff, effective electron chemical diffusion coefficient, Deff, effective electron diffusion length of the photoanode, Ln, charge transport resistance, Rct and transport resistance, Rt. � 2015, Springer Science+Business Media New York. | en_US |
dc.description.nature | Final | en_US |
dc.identifier.doi | 10.1007/s10854-015-2679-y | |
dc.identifier.epage | 2270 | |
dc.identifier.issue | 4 | |
dc.identifier.scopus | 2-s2.0-84925504242 | |
dc.identifier.spage | 2263 | |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84925504242&doi=10.1007%2fs10854-015-2679-y&partnerID=40&md5=c5401b3fbd744e219b60e6aaf9ae056a | |
dc.identifier.uri | https://irepository.uniten.edu.my/handle/123456789/22365 | |
dc.identifier.volume | 26 | |
dc.publisher | Springer Science and Business Media, LLC | en_US |
dc.source | Scopus | |
dc.sourcetitle | Journal of Materials Science: Materials in Electronics | |
dc.title | Structural, morphological, electrical and electron transport studies in ZnO�rGO (wt%�=�0.01, 0.05 and 0.1) based dye-sensitized solar cell | en_US |
dc.type | Article | en_US |
dspace.entity.type | Publication |