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Optical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rate

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dc.contributor.authorAhamed E.M.K.I.en_US
dc.contributor.authorDas N.K.en_US
dc.contributor.authorFarhad S.F.U.en_US
dc.contributor.authorKhan M.N.I.en_US
dc.contributor.authorMatin M.A.en_US
dc.contributor.authorAmin N.en_US
dc.contributor.authorid57204121738en_US
dc.contributor.authorid34867805900en_US
dc.contributor.authorid57219816966en_US
dc.contributor.authorid56610978700en_US
dc.contributor.authorid57220488718en_US
dc.contributor.authorid7102424614en_US
dc.date.accessioned2023-05-29T08:09:32Z
dc.date.available2023-05-29T08:09:32Z
dc.date.issued2020
dc.descriptionCadmium sulfide; Cadmium telluride; Copper compounds; Deposition rates; Energy gap; II-VI semiconductors; Lime; Magnetron sputtering; Refractive index; Substrates; Sulfur compounds; Thin film solar cells; Tin compounds; Zinc sulfide; Absorption co-efficient; Complex refractive index; Interference fringe pattern; Methodological frameworks; Optical characterization; RF magnetron sputtering technique; Soda lime glass substrate; Transmittance spectra; Thin filmsen_US
dc.description.abstractThin film Cadmium Sulfide (CdS) is a common n-type heteropartner for thin film Cadmium Telluride, Copper Indium Gallium Selenium and Copper Tin Zinc Sulfide based solar cells. This work reports the optical properties of CdS thin films which were synthesized onto soda-lime glass substrate by RF magnetron sputtering technique for different RF power. Analyzing the interference fringe pattern of the transmittance spectra and using the methodological framework of Swanepoel method, the film thickness as well as the deposition rate versus RF power characteristics has been deduced. The estimated thickness of the deposited CdS films were compared with the measured thickness by Dektak profilometer and found satisfactory. The deposition rate versus RF power characteristics offers an optimized recipe for fabricating CdS thin films of controlled thickness. In addition, optical energy bandgap, absorption coefficient and wavelength dependent complex refractive index have been calculated. The calculated bandgap energy values of the as-grown CdS films are around 2.42 eV to 2.44 eV and the complex refractive index lies the range of 2.35 to 2.50. Using this data researchers will be able to deposit CdS films of controlled thickness according to the needs. � 2020 IEEE.en_US
dc.description.natureFinalen_US
dc.identifier.ArtNo9230706
dc.identifier.doi10.1109/TENSYMP50017.2020.9230706
dc.identifier.epage1013
dc.identifier.scopus2-s2.0-85096423848
dc.identifier.spage1010
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85096423848&doi=10.1109%2fTENSYMP50017.2020.9230706&partnerID=40&md5=989db7912d66400db48885e001f86fb2
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/25448
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.sourceScopus
dc.sourcetitle2020 IEEE Region 10 Symposium, TENSYMP 2020
dc.titleOptical Characterization of Sputter Deposited CdS Thin Films and Measurement of Deposition Rateen_US
dc.typeConference Paperen_US
dspace.entity.typePublication
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