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Comparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flash

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dc.contributor.authorKong Kah Waien_US
dc.date.accessioned2023-05-03T13:36:35Z
dc.date.available2023-05-03T13:36:35Z
dc.date.issued2014-01
dc.descriptionTHS TK7895.K66 2014en_US
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/19531
dc.language.isoenen_US
dc.titleComparison reliability performance of single bit ECC and multi bit ECC for SLC NAND flashen_US
dc.typeResource Types::text::Thesisen_US
dspace.entity.typePublication
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