Publication:
Fabrication and characterization of cobalt (II) doped MOF-5 thin film

dc.contributor.authorTheeban a/l Muniandy
dc.date.accessioned2024-10-08T06:17:44Z
dc.date.available2024-10-08T06:17:44Z
dc.date.issued2017
dc.descriptionTP245.C7 T42 2017
dc.description.abstractIn this work, Cobalt (II) doped MOF-5 thin film was successfully synthesized and fabricated using spin coating technique. The main purpose of this research is to study the fabrication process of Cobalt (II) doped MOF-5 thin film and characterize the obtained samples. Cobalt (II) doped MOF-5 was characterized using XRD, Scherrer equation, SEM and EDX. Three prominent peaks were observed in the synthesized powder of Cobalt (II) doped MOF-5 attributable to the reflection planes of (200), (220) and (224) at 6.86°, 10.07° and 15.3° whereas two prominent peaks were observed in Cobalt (II) doped MOF-5 thin film attributes to the reflection plane if (200) and (400) at 9.05° and 13.7°. The morphology of Cobalt (II) doped MOF-5 thin film was faceted structure with an average size of ca 1 m. In addition, the morphology of Cobalt (II) doped MOF-5 thin film assisted with cubic crystal structure.
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/33765
dc.language.isoen
dc.subjectMetal ions
dc.titleFabrication and characterization of cobalt (II) doped MOF-5 thin film
dc.typeResource Types::text::Final Year Project
dspace.entity.typePublication
oaire.citation.endPage58
oaire.citation.startPage1
oairecerif.author.affiliation#PLACEHOLDER_PARENT_METADATA_VALUE#
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