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Characterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOS

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dc.contributor.authorIzahan Syemylona Ishaken_US
dc.date.accessioned2023-05-03T13:36:43Z
dc.date.available2023-05-03T13:36:43Z
dc.date.issued2005-03
dc.descriptionTHS TK7874.75.I92 2005en_US
dc.identifier.urihttps://irepository.uniten.edu.my/handle/123456789/19534
dc.language.isoenen_US
dc.titleCharacterization of RF substrate noise isolation and bandgap reference voltage of 0.18 um CMOSen_US
dc.typeResource Types::text::Thesisen_US
dspace.entity.typePublication
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